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Process and Control Today
pandct.com > news > new-software-from-micro-epsilon-enables-faster-more-efficient-3d-data-capture-and-surface-defect-evaluation

Process and Control Today | New software from Micro-Epsilon enables faster, more efficient 3D data capture and surface defect evaluation

3+ week, 5+ day ago   (336+ words) 19/08/2026 McLennan Servo Supplies Ltd 19/08/2026 Phoenix Contact Ltd 19/08/2026 Micro-Epsilon UK Ltd New 2D and 3D measurement programs More flexibility in sensor integration and evaluation Other key innovations in 3DInspect The functional extension surface inspection can be used to detect deviations from a homogeneous surface....